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Application of APM SP-1U/ST series in Fuse Test

Fuses play a very important protective role in the circuits of electronic appliances. They are classified into many types according to their usage environment, such as disposable fuses, resettable fuses, chip-type thermal fuses, metal film thermal fuses, mini plastic fuses, and mini precision explosion-proof fuses with different packaging. According to the different types of fuses, they can be applied to high and low voltage working environments.

The correct selection of fuses plays an indispensable role in ensuring the safe use of electronic equipment and power supply. Therefore, it is crucial to perform rigorous performance testing on fuses.

Below is fuse test systems customized by APM for customers.

This circuit is work via simple cable connection.



This testing system consists of four power supplies and testing software, as shown in the picture, with a testing current range of 100mA to 360A.

The DUT (Device Under Test) can be placed on the testing platform and wired easily and quickly. The testing system can measure the required fuse blowing time of the fuse, providing real measurement basis for selecting fuses for electrical equipment. Depending on the testing requirements, the system can also achieve the combination of power source and load to improve the rising speed of the current, the accuracy of the fuse blowing time, and the accuracy of the testing data.



The stable output of the power supply combined with this monitoring software enables more convenient remote communication control. The four channels can run independently without affecting each other, and the system can monitor the real-time voltage, current measurement values, testing time, power supply status, and fuse blowing status. Multiple sets of current values can be set to achieve cyclic output of current waveforms. The testing data can be recorded in the background according to the needs, including voltage values, current values, power supply status, fuse status, and aging times for data comparison in different testing environments.

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